Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12085515 | Methods and systems for selecting wafer locations to characterize cross-wafer variations based on high-throughput measurement signals | Jiqiang Li, Song Wu, Tianrong Zhan, Andrew Lagodzinski | 2024-09-10 |
| 5991546 | System and method for interfacing manually controllable input devices to a universal computer bus system | Teh-Hsin Philip Chan, Mike Chen, Arthur K. Hargrove, Scot Chuen Leung Hui, Jason Jzhong Lee +4 more | 1999-11-23 |