Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7547560 | Defect identification system and method for repairing killer defects in semiconductor devices | Oliver D. Patterson, David M. Shuttleworth, Werner Weck, Gregory Brown | 2009-06-16 |
| 7176781 | Structure and method for adjusting integrated circuit resistor value | Daniel Charles Kerr, Roger W. Key, William A. Russell, Alan S. Chen | 2007-02-13 |
| 7074628 | Test structure and method for yield improvement of double poly bipolar device | Thomas Craig Esry, Daniel Charles Kerr, Edward P. Martin, Jr., Oliver D. Patterson | 2006-07-11 |