| 12328896 |
Semiconductor integrated circuit component |
Thomas CABOUT |
2025-06-10 |
| 12087708 |
Chip protected against back-face attacks |
Sebastien Petitdidier, Nicolas Hotellier, Raul Andres Bianchi, Alexis Farcy |
2024-09-10 |
| 12063775 |
Read only memory |
Abderrezak Marzaki, Mathieu Lisart |
2024-08-13 |
| 12052376 |
Integrated physical unclonable function device |
Jean-Marc Voisin |
2024-07-30 |
| 11818883 |
Read only memory |
Abderrezak Marzaki, Mathieu Lisart |
2023-11-14 |
| 11183468 |
Chip protected against back-face attacks |
Sebastien Petitdidier, Nicolas Hotellier, Raul Andres Bianchi, Alexis Farcy |
2021-11-23 |
| 10833027 |
Integrated physically unclonable function device with a set of transistors exhibiting a random distribution of threshold voltages |
Mathieu Lisart, Raul Andres Bianchi |
2020-11-10 |
| 10770357 |
Integrated circuit with improved resistive region |
Stephan Niel, Arnaud Regnier, Abderrezak Marzaki |
2020-09-08 |
| 10754618 |
Random number generator |
Sebastien Petitdidier, Mathieu Lisart, Jean-Marc Voisin |
2020-08-25 |
| 10497653 |
Decoupling capacitor |
Mathieu Lisart |
2019-12-03 |
| 10354926 |
Integrated circuit with improved resistive region |
Stephan Niel, Arnaud Regnier, Abderrezak Marzaki |
2019-07-16 |
| 8975682 |
Integrated circuit comprising a capacitor with HSG metal electrodes |
Aomar Halimaoui, Rebha El Farhane |
2015-03-10 |
| 8354725 |
MIM transistor |
Etienne Robilliart |
2013-01-15 |
| 8295028 |
Increasing the capacitance of a capacitive device by micromasking |
— |
2012-10-23 |
| 7947583 |
Forming of silicide areas in a semiconductor device |
Delphine Aime |
2011-05-24 |
| 7781296 |
Integrated circuit comprising a capacitor with metal electrodes and process for fabricating such a capacitor |
Aomar Halimaoui, Rebha El Farhane |
2010-08-24 |
| 7638427 |
MOS transistor with fully silicided gate |
Delphine Aime |
2009-12-29 |
| 7622387 |
Gate electrode silicidation process |
Vidya Kaushik |
2009-11-24 |
| 7018865 |
Method of protecting an element of an integrated circuit against the formation of a metal silicide |
François Wacquant |
2006-03-28 |
| 6627093 |
Method of manufacturing a vertical metal connection in an integrated circuit |
Phillipe Gayet, Erik Van Der Vegt |
2003-09-30 |
| 6504380 |
Device and method for checking integrated capacitors |
Raul Andres Bianchi |
2003-01-07 |
| 6366098 |
Test structure, integrated circuit, and test method |
— |
2002-04-02 |
