Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12159445 | Method and system for identifying anomalies in X-rays | Rafael López González, Fabio García Castro, Ana Maria Jiménez Pastor, Angel Alberich Bayarri, Luis Martí Bonmatí | 2024-12-03 |