Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12159445 | Method and system for identifying anomalies in X-rays | Rafael López González, Belén Fos Guarinos, Ana Maria Jiménez Pastor, Angel Alberich Bayarri, Luis Martí Bonmatí | 2024-12-03 |
| 11915420 | Method for obtaining an image biomarker that quantifies the quality of the trabecular structure of bones | Angel Alberich Bayarri, Amadeo Ten Esteve, Luis Martí Bonmatí, María Ángeles Pérez Ansón | 2024-02-27 |