Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9939488 | Field triage of EOS failures in semiconductor devices | Joseph M. Salazar, Rich Ackerman, John Raykowski, Ralph Sanchez | 2018-04-10 |
| 9659136 | Suspect logical region synthesis from device design and test information | Ralph Sanchez | 2017-05-23 |
| 8918753 | Correlation of device manufacturing defect data with device electrical test data | Ralph Sanchez | 2014-12-23 |
| 8539389 | Correlation of device manufacturing defect data with device electrical test data | Ralph Sanchez | 2013-09-17 |
| 8453088 | Suspect logical region synthesis and simulation using device design and test information | Ralph Sanchez | 2013-05-28 |
| 5235273 | Apparatus for setting pin driver/sensor reference voltage level | Patrick L. Jennings | 1993-08-10 |
| 5216361 | Modular board test system having wireless receiver | Scott N. Grimes, Stephen E. DeSimone | 1993-06-01 |
| 5146159 | Pin driver for in-circuit test apparatus | Jack Lau, Hung-Wah A. Lau | 1992-09-08 |