Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12241911 | Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA) | Sergey Osechinskiy, Bede Pittenger, Syed-Asif Syed-Amanulla | 2025-03-04 |
| 11940461 | Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA) | Sergey Osechinskiy, Bede Pittenger, Syed-Asif Syed-Amanulla | 2024-03-26 |
| 11635449 | Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA) | Sergey Osechinskiy, Bede Pittenger, Syed-Asif Syed-Amanulla | 2023-04-25 |
| 11307220 | Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA) | Sergey Osechinskiy, Bede Pittenger, Syed-Asif Syed-Amanulla | 2022-04-19 |
| 11029330 | Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA) | Sergey Osechinskiy, Bede Pittenger, Syed-Asif Syed-Amanulla | 2021-06-08 |
| 10900997 | Low drift system for a metrology instrument | Andrew Neushul | 2021-01-26 |
| 9116168 | Low drift scanning probe microscope | Henry Mittel | 2015-08-25 |
| 8869310 | Low drift scanning probe microscope | Henry Mittel | 2014-10-21 |