Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7464357 | Integrated circuit capable of locating failure process layers | Chang-Song Lin, Tzu-Chun Liu, Huan-Yung Tseng | 2008-12-09 |
| 7089137 | Universal test platform and test method for latch-up | Jie Wang, Kai-Jen Ko | 2006-08-08 |
| 7036099 | Integrated circuit capable of locating failure process layers | Chang-Song Lin, Tzu-Chun Liu, Huan-Yung Tseng | 2006-04-25 |
| 6806142 | Method for coding semiconductor permanent store ROM | Kwo-Jen Liu, Chih-Hung Chen | 2004-10-19 |
| 6756275 | Method for minimizing product turn-around time for making semiconductor permanent store ROM cell | Kwo-Jen Liu, Chih-Hung Chen | 2004-06-29 |