AN

Amir Nahir

IBM: 16 patents #6,952 of 70,183Top 10%
AM Amazon: 2 patents #7,121 of 19,158Top 40%
Samsung: 2 patents #37,631 of 75,807Top 50%
Apple: 1 patents #12,251 of 18,612Top 70%
TL Technion Research & Development Foundation Limited: 1 patents #488 of 1,205Top 45%
Overall (All Time): #216,662 of 4,157,543Top 6%
20
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12417431 Techniques for generating collection of images Lee Abe Teichner, Sofia Gendelman, Ran Yad Shalom, Orel Shai, Shany Mordehai +5 more 2025-09-16
12052529 Techniques for obtaining images of items Sofia Gendelman, Orel Shai, Lee Abe Teichner, Ran Yad Shalom, Alex Umansky +2 more 2024-07-30
10983887 Validation of multiprocessor hardware component Sung-Boem Park, Vitali Sokhin, Wisam Kadry, Jin-Sung Park, Ara Cho 2021-04-20
10528443 Validation of multiprocessor hardware component Sung-Boem Park, Vitali Sokhin, Wisam Kadry, Jin-Sung Park, Ara Cho 2020-01-07
10387208 Distributed cloud computing elasticity Ariel Orda, Dan Raz 2019-08-20
9852037 Efficiency of cycle-reproducible debug processes in a multi-core environment James Nicholas Klazynski 2017-12-26
9804911 Concurrent validation of hardware units Randal Thelen, Yair Dagan, Yuval Gonczarowski 2017-10-31
9678151 Efficiency of cycle-reproducible debug processes in a multi-core environment James Nicholas Klazynski 2017-06-13
9626265 Efficiency of cycle-reproducible debug processes in a multi-core environment James Nicholas Klazynski 2017-04-18
9626267 Test generation using expected mode of the target hardware device Sung-Boem Park, Vitali Sokhin, Wisam Kadry, Jin-Sung Park, Ara Cho 2017-04-18
9569345 Architectural failure analysis Ophir Friedler, Wisam Kadry, Vitali Sokhin 2017-02-14
9513985 Efficiency of cycle-reproducible debug processes in a multi-core environment James Nicholas Klazynski 2016-12-06
9337845 Solving constraint satisfaction problems using a field programmable gate array Ilia Averbouch, Oded Margalit, Yehuda Naveh, Gil Shurek 2016-05-10
9251045 Control flow error localization Ophir Friedler, Wisam Kadry, Vitali Sokhin 2016-02-02
8990622 Post-silicon validation using a partial reference model Shimon Landa 2015-03-24
8892386 Method and apparatus for post-silicon testing Allon Adir, Eyal Bin, Shady Copty, Anatoly Koyfman, Shimon Landa +2 more 2014-11-18
8832502 Hardware verification using acceleration platform Manoj Dusanapudi, Wisam Kadry, Shakti Kapoor, Dimtry Krestyashyn, Shimon Landa +3 more 2014-09-09
8806270 Method, apparatus and product for testing transactions Allon Adir, Dimtry Krestyashyn, Charles Leverett Meissner 2014-08-12
8224614 Generating a combination exerciser for executing tests on a circuit Allon Adir, Maxim Golubev, Andrey Klinger 2012-07-17
7530036 Random test generation using an optimization solver Yossi Shiloach 2009-05-05