Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9274070 | System and process for measuring strain in materials at high spatial resolution | Jon Karl Weiss, Raman D. Narayan, Steven Kim, Stavros Nicolopoulos | 2016-03-01 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9274070 | System and process for measuring strain in materials at high spatial resolution | Jon Karl Weiss, Raman D. Narayan, Steven Kim, Stavros Nicolopoulos | 2016-03-01 |