Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10735004 | LUT-based focused ion beam friendly fill-cell design | Matthew YAP | 2020-08-04 |
| 6185713 | Method and apparatus for improving stuck-at fault detection in large scale integrated circuit testing | Kris Iniewski, Monika Swic, Curtis Lapadat, Larrie Simon Carr | 2001-02-06 |