Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6510076 | Variable read/write margin high-performance soft-error tolerant SRAM bit cell | Vikram Madhukar Labhe, Gavril Margittai, Mamta Bansal | 2003-01-21 |
| 6185713 | Method and apparatus for improving stuck-at fault detection in large scale integrated circuit testing | Alan Nakamoto, Kris Iniewski, Monika Swic, Larrie Simon Carr | 2001-02-06 |
| 5850153 | Tristatable output driver for use with 3.3 or 5 volt CMOS logic | Colin Harris | 1998-12-15 |
| 5835501 | Built-in test scheme for a jitter tolerance test of a clock and data recovery unit | Kamal Dalmia, Andre Ivanov, Brian D. Gerson | 1998-11-10 |