Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11237105 | System for measuring the absorption of a laser emission by a sample | — | 2022-02-01 |
| 11215637 | Method and apparatus of atomic force microscope based infrared spectroscopy with controlled probing depth | Anirban Roy, Honghua Yang | 2022-01-04 |
| 8607622 | High frequency deflection measurement of IR absorption | Rui Prazeres, Kevin Kjoller, Michael Reading | 2013-12-17 |
| 8001830 | High frequency deflection measurement of IR absorption | Rui Prazeres, Kevin Kjoller, Michael Reading | 2011-08-23 |