DP

Dominique Porta

📍 Karlsruhe, DE: #990 of 1,998 inventorsTop 50%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
12411098 System and method for determining mass fractions in a test sample with wave-length dispersive x-ray fluorescence spectrometers Fabian Nitsche 2025-09-09