Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12411098 | System and method for determining mass fractions in a test sample with wave-length dispersive x-ray fluorescence spectrometers | Dominique Porta | 2025-09-09 |
| 11678803 | System and method for improved measurement of peak intensities in pulse height spectra obtained by wave-length dispersive x-ray fluorescence spectrometers | — | 2023-06-20 |