Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7319343 | Low power scan design and delay fault testing technique using first level supply gating | Swarup Bhunia, Hamid Mahmoodi, Saibal Mukhopadhyay, Kaushik Roy | 2008-01-15 |