Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11195962 | High responsivity high bandwidth photodiode and method of manufacture | — | 2021-12-07 |
| 9280018 | Multistable reflective liquid crystal device | Nigel Mottram | 2016-03-08 |
| 9193618 | Glass alignment for high temperature processes | Donald Ross, Adam Stagnaro, Matthew Theobald, Michael K. Pilliod | 2015-11-24 |
| 8892238 | Edge break details and processing | Edward T. Sweet, Roberto Flores Ortega, Simon Lancaster, Thomas Johannessen | 2014-11-18 |
| 8549882 | Pre-processing techniques to produce complex edges using a glass slumping process | Michael K. Pilliod, Donald Ross | 2013-10-08 |
| 8526705 | Driven scanning alignment for complex shapes | Simon Lancaster | 2013-09-03 |
| 8336334 | Glass alignment for high temperature processes | Donald Ross, Adam Stagnaro, Matthew Theobald, Michael K. Pilliod | 2012-12-25 |
| 7330657 | Method to demultiplex wavelengths of light | — | 2008-02-12 |
| 7092644 | Optical receiver including a dual gain path amplifier system | — | 2006-08-15 |
| 6608847 | Tunable laser with suppression of spontaneous emission | Guangzhi Z. Zhang, David A. Robinson, Carter Hand, Mark Wippich, Murray Reed +1 more | 2003-08-19 |
| 6559946 | Method and apparatus to minimize effects of ASE in optical measurements | Jan-Willem Pieterse | 2003-05-06 |
| 5159262 | Method for measuring the electrical and optical performance of on-wafer microwave devices | Scott Rumbaugh | 1992-10-27 |
| 5047725 | Verification and correction method for an error model for a measurement network | Eric W. Strid | 1991-09-10 |
| 4905308 | Noise parameter determination method | — | 1990-02-27 |
| 4864218 | Method of compensating for frequency errors in noise power meters | Bernard W. Leake | 1989-09-05 |