Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12025660 | System of performing boundary scan test on pin through test point and method thereof | Qiu-Yue Duan, Xin-Ying Xie | 2024-07-02 |
| 11435400 | Test coverage rate improvement system for pins of tested circuit board and method thereof | Qiu-Yue Duan, Xin-Ying Xie | 2022-09-06 |