Issued Patents All Time
Showing 76–86 of 86 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6878589 | Method and system for improving short channel effect on a floating gate device | Yue-Song He, Richard Fastow | 2005-04-12 |
| 6864106 | Method and system for detecting tunnel oxide encroachment on a memory device | Zhigang Wang, Nian Yang | 2005-03-08 |
| 6828623 | Floating gate memory device with homogeneous oxynitride tunneling dielectric | Nian Yang, Zhigang Wang | 2004-12-07 |
| 6825083 | Method for reducing shallow trench isolation edge thinning on thin gate oxides to improve peripheral transistor reliability and performance for high performance flash memory devices | Nian Yang, John Jianshi Wang, Tien-Chun Yang | 2004-11-30 |
| 6822259 | Method of detecting and distinguishing stack gate edge defects at the source or drain junction | Zhigang Wang, Nian Yang | 2004-11-23 |
| 6778437 | Memory circuit for providing word line redundancy in a memory sector | Michael Achter | 2004-08-17 |
| 6646462 | Extraction of drain junction overlap with the gate and the channel length for ultra-small CMOS devices with ultra-thin gate oxides | Nian Yang, Zhigang Wang | 2003-11-11 |
| 6617639 | Use of high-K dielectric material for ONO and tunnel oxide to improve floating gate flash memory coupling | Zhigang Wang, Yue-Song He | 2003-09-09 |
| 6606273 | Methods and systems for flash memory tunnel oxide reliability testing | Nian Yang, Zhigang Wang | 2003-08-12 |
| 6570787 | Programming with floating source for low power, low leakage and high density flash memory devices | Zhigang Wang, Nian Yang | 2003-05-27 |
| 6438037 | Threshold voltage compacting for non-volatile semiconductor memory designs | Richard Fastow, Sameer Haddad | 2002-08-20 |