RD

Robert W. Daywitt

IN Intel: 1 patents #18,218 of 30,777Top 60%
Overall (All Time): #3,641,687 of 4,157,543Top 90%
1
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
5869977 Defect insertion testability mode for IDDQ testing methods Jeffrey C. Kalb, Jr. 1999-02-09