Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 5869977 | Defect insertion testability mode for IDDQ testing methods | Jeffrey C. Kalb, Jr. | 1999-02-09 | $168,808,000 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 5869977 | Defect insertion testability mode for IDDQ testing methods | Jeffrey C. Kalb, Jr. | 1999-02-09 | $168,808,000 |