Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11815810 | Measurement tool and methods for EUV lithography masks | Yoshihiro Tezuka, Charles W. Holzwarth | 2023-11-14 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11815810 | Measurement tool and methods for EUV lithography masks | Yoshihiro Tezuka, Charles W. Holzwarth | 2023-11-14 |