Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 7685485 | Functional failure analysis techniques for programmable integrated circuits | Binh Vo, Wan-Pin Hung, David Huang, Peter Boyle, Qi Richard Chen +4 more | 2010-03-23 | $6,021,000 |
| 7194666 | Bit error rate tester implemented in a programmable logic device | San Wong | 2007-03-20 | $8,472,000 |