Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7685485 | Functional failure analysis techniques for programmable integrated circuits | Binh Vo, Wan-Pin Hung, David Huang, Peter Boyle, Qi Richard Chen +4 more | 2010-03-23 |
| 7194666 | Bit error rate tester implemented in a programmable logic device | San Wong | 2007-03-20 |