Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6829553 | Method of and apparatus for measuring the correctness of and correcting an automatic test arrangement | Sunil K. Jain | 2004-12-07 |
| 6665627 | Method and apparatus for evaluating and correcting the tester derating factor (TDF) in a test environment | Sunil K. Jain | 2003-12-16 |