Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4374915 | High contrast alignment marker for integrated circuit fabrication | Yaw Wen Hu, Peter Schoen, Paul Poenisch | 1983-02-22 |
| 4231811 | Variable thickness self-aligned photoresist process | Sasson Somekh | 1980-11-04 |