Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9759763 | Damage reduction method and apparatus for destructive testing of power semiconductors | Rodney E. Schwartz, David A. Lohr, Gary Rogers, James Baggiore | 2017-09-12 |
| 7521947 | Probe needle protection method for high current probe testing of power devices | Gary Rogers, Rodney E. Schwartz, Taichi Ukai, Joe Lambright, Dave Lohr | 2009-04-21 |