Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 12504472 | Test circuit and test apparatus comprising the test circuit | Wen-Jeng Fan, Zhiguo Chang | 2025-12-23 | |
| 10866282 | Method for calibrating channel delay skew of automatic test equipment | Yong Wang, Weidong Fan, Ronghui Chen, Meng MEI | 2020-12-15 | |
| 8254515 | Method for measuring phase locked loop bandwidth parameters for high-speed serial links | Pengfei Hu, Junqiang Shang, Xin Peng Liu | 2012-08-28 | $2,066,000 |