YH

Yi-Wei Hsieh

IM Inotera Memories: 1 patents #47 of 129Top 40%
Overall (All Time): #3,298,501 of 4,157,543Top 80%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
7772015 Observation method of wafer ion implantation defect Jeremy Russell, Pei-Yi Chen 2010-08-10