Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7772015 | Observation method of wafer ion implantation defect | Yi-Wei Hsieh, Pei-Yi Chen | 2010-08-10 |
| 6731824 | Spatial filtering method for failure analysis of a device | — | 2004-05-04 |