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Velt Klee

Infineon Technologies Ag: 1 patents #4,439 of 7,486Top 60%
📍 Pleasant Valley, NY: #105 of 156 inventorsTop 70%
🗺 New York: #67,335 of 115,490 inventorsTop 60%
Overall (All Time): #3,555,532 of 4,157,543Top 90%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6440759 Method of measuring combined critical dimension and overlay in single step Martin Commons, Tobias Mono, John Pohl, Paul Wensley 2002-08-27