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Semiconductor devices and processing methods |
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Test method and test arrangement |
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2016-08-30 |
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Markus Zundel |
2016-05-17 |
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Method of manufacturing a semiconductor device including a stress relief layer |
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| 9184284 |
Method for operating field-effect transistor, field-effect transistor and circuit configuration |
Markus Zundel |
2015-11-10 |
| 9165921 |
Transistor cell array including semiconductor diode |
Markus Zundel |
2015-10-20 |
| 9099419 |
Test method and test arrangement |
Markus Zundel, Franz Hirler |
2015-08-04 |
| 9054150 |
Chip edge sealing |
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2015-06-09 |
| 8803297 |
Semiconductor device including a stress relief layer and method of manufacturing |
Uwe Schmalzbauer, Juergen Holzmueller, Markus Zundel |
2014-08-12 |
| 8188592 |
Apparatus and method configured to lower thermal stresses |
Matthias Stecher |
2012-05-29 |
| 8021929 |
Apparatus and method configured to lower thermal stresses |
Matthias Stecher |
2011-09-20 |
| 7943960 |
Integrated circuit arrangement including a protective structure |
Joachim Weyers |
2011-05-17 |
| 7888782 |
Apparatus and method configured to lower thermal stresses |
Matthias Stecher |
2011-02-15 |
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Vertical bipolar transistor |
Matthias Stecher |
2005-05-17 |
| 6800925 |
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Ludwig Rossmeier, Norbert Krischke, Wolfgang Werner |
2004-10-05 |
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Metal ion source and a method of producing metal ions |
Andreas Kluge |
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