Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12222322 | System and method for the acoustic detection of cracks in a semiconductor substrate | Oliver Nagler | 2025-02-11 |
| 10859534 | System and method for examining semiconductor substrates | Oliver Nagler, Sebastian Bernrieder | 2020-12-08 |