Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8323991 | Method for detecting stress migration properties | Armin Fischer, Alexander Von Glasow | 2012-12-04 |
| 7888672 | Device for detecting stress migration properties | Armin Fischer, Alexander Von Glasow | 2011-02-15 |
| 6787799 | Device and method for detecting a reliability of integrated semiconductor components at high temperatures | Wilhelm Asam, Josef Fazekas, Andreas Martin, David Smeets | 2004-09-07 |