Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6873170 | Method for detecting the reliability of integrated semiconductor components at high temperatures | Wilhelm Asam, Josef Fazekas, Andreas Martin, Jochen Hagen | 2005-03-29 |
| 6787799 | Device and method for detecting a reliability of integrated semiconductor components at high temperatures | Wilhelm Asam, Josef Fazekas, Andreas Martin, Jochen Von Hagen | 2004-09-07 |