Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7518231 | Differential chip performance within a multi-chip package | Petros Negussu, Thoai-Thai Le | 2009-04-14 |
| 7449909 | System and method for testing one or more dies on a semiconductor wafer | David Ma, Tao Wang, Bing Ren | 2008-11-11 |
| 7305594 | Integrated circuit in a maximum input/output configuration | David Ma | 2007-12-04 |
| 7242208 | System and method for testing one or more dies on a semiconductor wafer | David Ma, Tao Wang, Bing Ren | 2007-07-10 |
| 7119567 | System and method for testing one or more dies on a semiconductor wafer | David Ma, Tao Wang, Bing Ren | 2006-10-10 |
| 6888365 | Semiconductor wafer testing system | Daivid SuitWai Ma, George Alexander | 2005-05-03 |
| 6847232 | Interchangeable CML/LVDS data transmission circuit | Steven Tinsley, Mark W. Morgan | 2005-01-25 |
| 6702589 | Leadless socket for decapped semiconductor device | David Ma, Bing Ren | 2004-03-09 |