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Martien Johanna Maria Godelieve Bernard Baeyens

IM Imec: 1 patents #297 of 687Top 45%
📍 Oostende, BE: #19 of 33 inventorsTop 60%
Overall (All Time): #3,674,890 of 4,157,543Top 90%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
5712168 Method for evaluating, monitoring or controlling the efficiency, stability, or exhaustion of a complexing or chelating agent present in a chemical solution used for oxidizing, dissolving, etching or stripping a semiconductor wafer Harald Schmidt, Marc Heyns, Paul Mertens 1998-01-27