Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12253499 | Thin-layer chromatography system and method for assessing analyte concentrations in samples | Stuart Ibsen, Alaric Taylor, Luis Antonio Serrano Gonzalez, Stefan Guldin | 2025-03-18 |
| 12099304 | Electron beam lithography with dynamic fin overlay correction | Ernst Kratschmer | 2024-09-24 |
| 11852975 | Electron beam lithography with dynamic fin overlay correction | Ernst Kratschmer | 2023-12-26 |