| 5854486 |
Method and apparatus for MALDI mass spectrometry |
— |
1998-12-29 |
| 4845425 |
Full chip integrated circuit tester |
Johannes G. Beha, Jeffrey A. Kash, Gary W. Rubloff |
1989-07-04 |
| 4786864 |
Photon assisted tunneling testing of passivated integrated circuits |
Johannes G. Beha, Allan M. Hartstein, Gary W. Rubloff |
1988-11-22 |
| 4706018 |
Noncontact dynamic tester for integrated circuits |
Johannes G. Beha, Gary W. Rubloff |
1987-11-10 |
| 4703260 |
Full chip integrated circuit tester |
Johannes G. Beha, Jeffrey A. Kash, Gary W. Rubloff |
1987-10-27 |
| 4687539 |
End point detection and control of laser induced dry chemical etching |
Francis Charles Burns, John R. Susko |
1987-08-18 |
| 4670710 |
Noncontact full-line dynamic AC tester for integrated circuits |
Johannes G. Beha, Gary W. Rubloff |
1987-06-02 |
| 4644264 |
Photon assisted tunneling testing of passivated integrated circuits |
Johannes G. Beha, Allan M. Hartstein, Gary W. Rubloff |
1987-02-17 |
| 4352117 |
Electron source |
Jerome J. Cuomo, Jerry M. Woodall |
1982-09-28 |
| 4269067 |
Method and apparatus for focusing elastic waves converted from thermal energy |
Eugene E. Tynan, Robert J. von Gutfeld |
1981-05-26 |
| 4240007 |
Microchannel ion gun |
Nicholas A. Penebre, Richard A. McCorkle |
1980-12-16 |
| 4236179 |
Versatile microsecond multiple framing camera |
Alfred J. Landon |
1980-11-25 |
