Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5008878 | High-speed modular switching apparatus for circuit and packet switched traffic | Hamid Ahmadi, Wolfgang Denzel, Antonius Engbersen, Ronald P. Luijten, Charles A. Murphy +1 more | 1991-04-16 |
| 4999577 | Method for contactless testing of conducting paths in a substrate using photon-assisted tunneling | Armin U. Blacha, Rolf Clauberg, Hugo K. Seitz | 1991-03-12 |
| 4918309 | Method for investigating surfaces at nanometer and picosecond resolution and laser-sampled scanning tunneling microscope for performing said method | Armin U. Blacha, Rolf Clauberg, Rolf B. Moeller, Wolfgang D. Pohl | 1990-04-17 |
| 4868492 | Method for contactless testing of conducting paths in a substrate using photo-assisted tunneling | Armin U. Blacha, Rolf Clauberg, Hugo K. Seitz | 1989-09-19 |
| 4845425 | Full chip integrated circuit tester | Russell W. Dreyfus, Jeffrey A. Kash, Gary W. Rubloff | 1989-07-04 |
| 4843329 | Method for contactless testing for electrical opens and short circuits in conducting paths in a substrate | Armin U. Blacha, Rolf Clauberg, Hugo K. Seitz | 1989-06-27 |
| 4786864 | Photon assisted tunneling testing of passivated integrated circuits | Russell W. Dreyfus, Allan M. Hartstein, Gary W. Rubloff | 1988-11-22 |
| 4706018 | Noncontact dynamic tester for integrated circuits | Russell W. Dreyfus, Gary W. Rubloff | 1987-11-10 |
| 4703260 | Full chip integrated circuit tester | Russell W. Dreyfus, Jeffrey A. Kash, Gary W. Rubloff | 1987-10-27 |
| 4670710 | Noncontact full-line dynamic AC tester for integrated circuits | Russell W. Dreyfus, Gary W. Rubloff | 1987-06-02 |
| 4644264 | Photon assisted tunneling testing of passivated integrated circuits | Russell W. Dreyfus, Allan M. Hartstein, Gary W. Rubloff | 1987-02-17 |
| 4525730 | Buried junction Josephson interferometer | Heinz Jaeckel, Peter Vettiger | 1985-06-25 |