Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5544775 | Laser machined slider | Randall T. Kerth, Douglas J. Krajnovich, Wing P. Leung, Andrew Ching Tam | 1996-08-13 |
| 4844616 | Interferometric dimensional measurement and defect detection method | William H. Lancaster, Jr. | 1989-07-04 |
| 4590574 | Method for determining oxygen and carbon in silicon semiconductor wafer having rough surface | Harold D. Edmonds | 1986-05-20 |
| 4506158 | Dual mode spectrometer test station | Robert H. Cadwallader, Harold D. Edmonds | 1985-03-19 |
| 4432809 | Method for reducing oxygen precipitation in silicon wafers | Patrick W. Chye, Eric W. Hearn, Gary Markovits | 1984-02-21 |