Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4590574 | Method for determining oxygen and carbon in silicon semiconductor wafer having rough surface | Murlidhar V. Kulkarni | 1986-05-20 |
| 4506158 | Dual mode spectrometer test station | Robert H. Cadwallader, Murlidhar V. Kulkarni | 1985-03-19 |
| 4364100 | Multi-layered metallized silicon matrix substrate | Gary Markovits | 1982-12-14 |
| 4261781 | Process for forming compound semiconductor bodies | Vincent J. Lyons, Gary Markovits | 1981-04-14 |