Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7757125 | Defect resolution methodology and data defects quality/risk metric model extension | Kathryn A. Bassin, Clyde J. Bearss, Susan E. Skrabanek, Crystal F. Springer | 2010-07-13 |