Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7757125 | Defect resolution methodology and data defects quality/risk metric model extension | Kathryn A. Bassin, Linda Marie Clough, Susan E. Skrabanek, Crystal F. Springer | 2010-07-13 |
CB
Clyde J. Bearss
Overall (All Time): #3,295,685 of 4,157,543Top 80%
1
Patents All Time