Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6788093 | Methodology and apparatus using real-time optical signal for wafer-level device dielectrical reliability studies | John M. Aitren, Fen Chen, Kevin L. Condon, Mark F. Dionne | 2004-09-07 |