DS

Deepak Ranjan Sahoo

IBM: 6 patents #16,453 of 70,183Top 25%
IU Iowa State University: 4 patents #160 of 1,643Top 10%
TS The University Of Sussex: 3 patents #8 of 51Top 20%
Overall (All Time): #373,236 of 4,157,543Top 9%
13
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
11785384 Acoustic wave manipulation Sriram Subramanian, Gianluca Memoli, Bruce Drinkwater, Mihai Caleap 2023-10-10
11228838 Acoustic wave manipulation by means of a time delay array Sriram Subramanian, Gianluca Memoli, Bruce Drinkwater, Mihai Caleap 2022-01-18
10873812 Acoustic wave manipulation by means of a time delay array Sriram Subramanian, Gianluca Memoli, Bruce Drinkwater, Mihai Caleap 2020-12-22
8819860 Device comprising a cantilever and scanning system Michel Despont, Venkataraman Kartik, Charalampos Pozidis 2014-08-26
8689358 Dynamic mode nano-scale imaging and position control using deflection signal direct sampling of higher mode-actuated microcantilevers Venkataraman Kartik, Charalampos Pozidis, Abu Sebastian 2014-04-01
8484760 Device comprising a cantilever and scanning system Michael Despont, Venkataraman Kartik, Charalampos Pozidis 2013-07-09
8395877 High-speed electrostatic actuation of MEMS-based devices Charalampos Pozidis, Angeliki Pantazi, Abu Sebastian 2013-03-12
8026715 Magneto-resistance based nano-scale position sensor Charalampos Pozidis, Abu Sebastian 2011-09-27
8026719 Magneto-resistance based topography sensing Peter Baechtold, Urs T. Duerig, Walter Haeberle, Armin W. Knoll, Charalampos Pozidis +2 more 2011-09-27
7627438 Observer based Q-control imaging methods for atomic force microscopy Murti V. Salapaka 2009-12-01
7360405 Method to transiently detect sample features using cantilevers Murti V. Salapaka, Abu Sebastian 2008-04-22
7313948 Real time detection of loss of cantilever sensing loss Murti V. Salapaka, Tathagata De, Pranav Agarwal 2008-01-01
7066014 Method to transiently detect samples in atomic force microscopes Murti V. Salapaka, Abu Sebastian 2006-06-27