Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11785384 | Acoustic wave manipulation | Sriram Subramanian, Gianluca Memoli, Bruce Drinkwater, Mihai Caleap | 2023-10-10 |
| 11228838 | Acoustic wave manipulation by means of a time delay array | Sriram Subramanian, Gianluca Memoli, Bruce Drinkwater, Mihai Caleap | 2022-01-18 |
| 10873812 | Acoustic wave manipulation by means of a time delay array | Sriram Subramanian, Gianluca Memoli, Bruce Drinkwater, Mihai Caleap | 2020-12-22 |
| 8819860 | Device comprising a cantilever and scanning system | Michel Despont, Venkataraman Kartik, Charalampos Pozidis | 2014-08-26 |
| 8689358 | Dynamic mode nano-scale imaging and position control using deflection signal direct sampling of higher mode-actuated microcantilevers | Venkataraman Kartik, Charalampos Pozidis, Abu Sebastian | 2014-04-01 |
| 8484760 | Device comprising a cantilever and scanning system | Michael Despont, Venkataraman Kartik, Charalampos Pozidis | 2013-07-09 |
| 8395877 | High-speed electrostatic actuation of MEMS-based devices | Charalampos Pozidis, Angeliki Pantazi, Abu Sebastian | 2013-03-12 |
| 8026715 | Magneto-resistance based nano-scale position sensor | Charalampos Pozidis, Abu Sebastian | 2011-09-27 |
| 8026719 | Magneto-resistance based topography sensing | Peter Baechtold, Urs T. Duerig, Walter Haeberle, Armin W. Knoll, Charalampos Pozidis +2 more | 2011-09-27 |
| 7627438 | Observer based Q-control imaging methods for atomic force microscopy | Murti V. Salapaka | 2009-12-01 |
| 7360405 | Method to transiently detect sample features using cantilevers | Murti V. Salapaka, Abu Sebastian | 2008-04-22 |
| 7313948 | Real time detection of loss of cantilever sensing loss | Murti V. Salapaka, Tathagata De, Pranav Agarwal | 2008-01-01 |
| 7066014 | Method to transiently detect samples in atomic force microscopes | Murti V. Salapaka, Abu Sebastian | 2006-06-27 |