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High speed memory interface |
Amin Shokrollahi, Brian Holden |
2019-11-05 |
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System for generating a test pattern to detect and isolate stuck faults for an interface using transition coding |
Andrew Kevin John Stewart, John D. Keay |
2017-12-26 |
| 8249177 |
Detection of frame marker quality |
Etai Adar, Michael Bar-Joshua |
2012-08-21 |
| 8135558 |
Automated simulation testbench generation for serializer/deserializer datapath systems |
Francis A. Kampf, Jeanne Trinko-Mechler |
2012-03-13 |
| 8051359 |
System and method for optimizing iterative circuit for cyclic redundency check (CRC) calculation |
Ming-i Mark Lin |
2011-11-01 |
| 7444258 |
Automated simulation testbench generation for serializer/deserializer datapath systems |
Francis A. Kampf, Jeanne Trinko-Mechler |
2008-10-28 |
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Method, system and program product for building an automated datapath system generating tool |
Jeanne Trinko-Mechler |
2007-10-30 |
| 7242737 |
System and method for data phase realignment |
Sheehan D. Lake |
2007-07-10 |
| 7191383 |
System and method for optimizing iterative circuit for cyclic redundancy check (CRC) calculation |
Ming-i Mark Lin |
2007-03-13 |
| 6993671 |
High speed clock divider with synchronous phase start-up over physically distributed space |
Douglas C. Pricer |
2006-01-31 |
| 5954824 |
Test mode matrix circuit for an embedded microprocessor core |
Cory Ansel Cherichetti, Peter Stewart Colyer |
1999-09-21 |
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Test mode matrix circuit for an embedded microprocessor core |
Cory Ansel Cherichetti, Peter Stewart Colyer |
1998-03-03 |
| 5671443 |
Direct memory access acceleration device for use in a data processing system |
Rebecca Stempski McMahon |
1997-09-23 |
| 5394390 |
FDDI network test adapter history store circuit (HSC) |
Rebecca Stempski McMahon, Thomas J. Eckenrode |
1995-02-28 |
| 5363379 |
FDDI network test adaptor error injection circuit |
Thomas J. Eckenrode, Rebecca Stempski |
1994-11-08 |