Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6879719 | Method for measurement of full-two dimensional submicron shapes | Edward W. Conrad | 2005-04-12 |
| 5963329 | Method and apparatus for measuring the profile of small repeating lines | Edward W. Conrad | 1999-10-05 |