Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5798301 | Method of manufacturing metal interconnect structure for an integrated circuit with improved electromigration reliability | Pei-Ing Lee, Bernd Vollmer, Darryl D. Restaino | 1998-08-25 |
| 5641992 | Metal interconnect structure for an integrated circuit with improved electromigration reliability | Pei-Ing Lee, Bernd Vollmer, Darryl D. Restaino | 1997-06-24 |