Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8086925 | Method and system for LBIST testing of an electronic circuit | Abel Alaniz, Asher Shlomo Lazarus, Timothy M. Skergan | 2011-12-27 |
| 7895490 | Method and system for testing an electronic circuit to identify multiple defects | Abel Alaniz, Asher Shlomo Lazarus, Timothy M. Skergan | 2011-02-22 |