Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7235994 | Defect monitor for semiconductor manufacturing capable of performing analog resistance measurements | Norman K. James | 2007-06-26 |
| 4967151 | Method and apparatus for detecting faults in differential current switching logic circuits | David Kiesling, Mark D. Mayo, Walter A. Svarczkopf | 1990-10-30 |