Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5821766 | Method and apparatus for measuring the metallurgical channel length of a semiconductor device | Sung Ki Kim, Jin-Hyoung Kim, Dai H. Lee, Han-Sub Yoon | 1998-10-13 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5821766 | Method and apparatus for measuring the metallurgical channel length of a semiconductor device | Sung Ki Kim, Jin-Hyoung Kim, Dai H. Lee, Han-Sub Yoon | 1998-10-13 |